文献
J-GLOBAL ID:202102212440407832
整理番号:21A2638397
ナノスケール真空チャネルトランジスタの環境適応性と故障解析【JST・京大機械翻訳】
Environments Adaptability and Failure Analysis of Nanoscale Vacuum Channel Transistors
著者 (6件):
Li Xinghui
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
,
Han Panyang
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
,
Xie Yunzhu
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
,
Du Ting
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
,
Cai Jun
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
,
Feng Jinjun
(Beijing Vacuum Electronics Research Institute,National Key Laboratory of Science and Technology on Vacuum Electronics,Beijing,China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
IVEC
ページ:
381-382
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)