文献
J-GLOBAL ID:202102216942717928
整理番号:21A0149952
Schottky接合を有するマルチフィンガゲートトンネルFETの物理電流モデル【JST・京大機械翻訳】
A Physical Current Model for Multi-Finger Gate Tunneling FET with Schottky Junction
著者 (6件):
Li Yimei
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics Peking University,Beijing,China,100871)
,
Luo Jin
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics Peking University,Beijing,China,100871)
,
Huang Qianqian
(Peking University Information Technology Institute (Tianjin Binhai))
,
An Xia
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics Peking University,Beijing,China,100871)
,
Ye Le
(Peking University Information Technology Institute (Tianjin Binhai))
,
Huang Ru
(Peking University Information Technology Institute (Tianjin Binhai))
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
CSTIC
ページ:
1-3
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)