文献
J-GLOBAL ID:202102236179930764
整理番号:21A0612924
ナノスケール電圧センシング応用のための単一Electronボックスアレイの無線周波数反射測定【JST・京大機械翻訳】
Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications
著者 (12件):
Zirkle Thomas A.
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
,
Zirkle Thomas A.
(Northrop Grumman, Ogden, UT 84405, USA)
,
Filmer Matthew J.
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
,
Filmer Matthew J.
(L3Harris, Fort Wayne, IN 46818, USA)
,
Chisum Jonathan
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
,
Orlov Alexei O.
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
,
Dupont-Ferrier Eva
(Institut Quantique, Universite de Sherbrooke, Sherbrooke, QC J1K 2R1, Canada)
,
Rivard Joffrey
(Institut Quantique, Universite de Sherbrooke, Sherbrooke, QC J1K 2R1, Canada)
,
Huebner Matthew
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
,
Sanquer Marc
(PHELIQS-LATEQS, Universite Grenoble-Alpes and CEA-Grenoble, 38054 Grenoble, France)
,
Jehl Xavier
(PHELIQS-LATEQS, Universite Grenoble-Alpes and CEA-Grenoble, 38054 Grenoble, France)
,
Snider Gregory L.
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA)
資料名:
Applied Sciences (Web)
(Applied Sciences (Web))
巻:
10
号:
24
ページ:
8797
発行年:
2020年
JST資料番号:
U7135A
ISSN:
2076-3417
資料種別:
逐次刊行物 (A)
記事区分:
文献レビュー
発行国:
スイス (CHE)
言語:
英語 (EN)