文献
J-GLOBAL ID:202102239612201987
整理番号:21A2225832
AlGaN/GaN HEMTのデバイス性能に対する裏面ドライエッチングの効果【JST・京大機械翻訳】
Effect of backside dry etching on the device performance of AlGaN/GaN HEMTs
著者 (18件):
Ji Keyu
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Ji Keyu
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Cui Xiao
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Cui Xiao
(School of Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing, 100049, People’s Republic of China)
,
Chen Jiwei
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Chen Jiwei
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Guo Qi
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Guo Qi
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Jiang Bing
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Jiang Bing
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Wang Bingjun
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Wang Bingjun
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Sun Wenhong
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Hu Weiguo
(Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi, 530004, People’s Republic of China)
,
Hu Weiguo
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Hu Weiguo
(School of Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing, 100049, People’s Republic of China)
,
Hua Qilin
(CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 101400, People’s Republic of China)
,
Hua Qilin
(School of Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing, 100049, People’s Republic of China)
資料名:
Nanotechnology
(Nanotechnology)
巻:
32
号:
35
ページ:
355203 (5pp)
発行年:
2021年
JST資料番号:
W0108A
ISSN:
0957-4484
CODEN:
NNOTER
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)