文献
J-GLOBAL ID:202102245667819497
整理番号:21A0175377
室温アプローチによる高電子移動度トランジスタ用の(Al)GaNバッファ中の炭素関連トラップエネルギー準位の決定【JST・京大機械翻訳】
Determination of carbon-related trap energy level in (Al)GaN buffers for high electron mobility transistors through a room-temperature approach
著者 (11件):
Chen Xin
(State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, 5340 Xiping Road, Tianjin 300401, People’s Republic of China)
,
Zhong Yaozong
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Zhou Yu
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Gao Hongwei
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Zhan Xiaoning
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Su Shuai
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Guo Xiaolu
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Sun Qian
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
,
Zhang Zihui
(State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, 5340 Xiping Road, Tianjin 300401, People’s Republic of China)
,
Bi Wengang
(State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, 5340 Xiping Road, Tianjin 300401, People’s Republic of China)
,
Yang Hui
(Key Laboratory of Nano-Devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou 215123, People’s Republic of China)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
117
号:
26
ページ:
263501-263501-7
発行年:
2020年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)