文献
J-GLOBAL ID:202102247279665510
整理番号:21A0463759
X線光電子分光法を用いた単分子層およびサブ単分子層膜の研究【JST・京大機械翻訳】
Investigation of monolayer and submonolayer films using X-ray photoelectron spectroscopy
著者 (5件):
Afanas’ev V P
(National Research University ≪Moscow Power Engineering Institute≫, 111250, Russia, Moscow, Krasnokazarmennaya 14)
,
Selyakov D N
(National Research University ≪Moscow Power Engineering Institute≫, 111250, Russia, Moscow, Krasnokazarmennaya 14)
,
Ridzel O Yu
(Schlumberger Moscow Research SMR, 125171, Russia, Moscow, Leningradskoe shosse 16A/3)
,
Semenov-Shefov M A
(National Research University ≪Moscow Power Engineering Institute≫, 111250, Russia, Moscow, Krasnokazarmennaya 14)
,
Strukov A N
(The Southwest State University (SWSU), 305040, Russia, Kursk, 50 Let Oktyabrya 94)
資料名:
Journal of Physics: Conference Series
(Journal of Physics: Conference Series)
巻:
1713
号:
1
ページ:
012002 (5pp)
発行年:
2020年
JST資料番号:
W5565A
ISSN:
1742-6588
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)