文献
J-GLOBAL ID:202102249750431387
整理番号:21A0013209
先進FinFETのための電力性能信頼性ブースタとしての冷CMOS【JST・京大機械翻訳】
Cold CMOS as a Power-Performance-Reliability Booster for Advanced FinFETs
著者 (15件):
Chiang H. L.
(Institute of Electronics, National Chiao-Tung University,Hsinchu,Taiwan,R.O.C.)
,
Chen T. C.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Wang J. F.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Mukhopadhyay S.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Lee W. K.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Chen C. L.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Khwa W.S.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Pulicherla B.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Liao P. J.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Su K. W.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Yu K. F.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Wang T.
(Institute of Electronics, National Chiao-Tung University,Hsinchu,Taiwan,R.O.C.)
,
Wong H.-S. P.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Diaz C. H.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
,
Cai J.
(Taiwan Semiconductor Manufacturing Company,Hsinchu,Taiwan,R.O.C.)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
VLSI Technology
ページ:
1-2
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)