文献
J-GLOBAL ID:202102259222500871
整理番号:21A0577095
高アスペクト比の小型内部構造の精密測定のための球状散乱電場プローブの表面電荷分布と点プロービング特性の定量的研究【JST・京大機械翻訳】
Quantitative Investigation of Surface Charge Distribution and Point Probing Characteristics of Spherical Scattering Electrical Field Probe for Precision Measurement of Miniature Internal Structures with High Aspect Ratios
著者 (12件):
Bian Xingyuan
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Bian Xingyuan
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
,
Cui Junning
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Cui Junning
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
,
Lu Yesheng
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Lu Yesheng
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
,
Zhao Yamin
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Zhao Yamin
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
,
Cheng Zhongyi
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Cheng Zhongyi
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
,
Tan Jiubin
(Center of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China)
,
Tan Jiubin
(Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China)
資料名:
Applied Sciences (Web)
(Applied Sciences (Web))
巻:
10
号:
15
ページ:
5268
発行年:
2020年
JST資料番号:
U7135A
ISSN:
2076-3417
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
スイス (CHE)
言語:
英語 (EN)