文献
J-GLOBAL ID:202102264845913866
整理番号:21A0328607
V字型二重スリットの伝搬距離を光学的にゼロにした電子干渉実験
Electron interference experiment with optically zero propagation distance for V-shaped double slit
著者 (7件):
Harada Ken
(CEMS, RIKEN (Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan)
,
Akashi Tetsuya
(Research & Development Group, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan)
,
Takahashi Yoshio
(Research & Development Group, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan)
,
Kodama Tetsuji
(Graduate School of Science & Technology, Meijo University, Nagoya, Aichi 468-8502, Japan)
,
Shimada Keiko
(CEMS, RIKEN (Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan)
,
Ono Yoshimasa A.
(CEMS, RIKEN (Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan)
,
Mori Shigeo
(Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan)
資料名:
Applied Physics Express
(Applied Physics Express)
巻:
14
号:
2
ページ:
022006 (5pp)
発行年:
2021年02月
JST資料番号:
F0599C
ISSN:
1882-0778
CODEN:
APEPC4
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)