文献
J-GLOBAL ID:202102276199111523
整理番号:21A0067110
CAM-UNET:欠陥セグメンテーションのためのフィードバック精密化によるクラス活性化MAP誘導UNET【JST・京大機械翻訳】
CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement for Defect Segmentation
著者 (6件):
Lin Dongyun
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
,
Li Yiqun
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
,
Prasad Shitala
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
,
Nwe Tin Lay
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
,
Dong Sheng
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
,
Oo Zaw Min
(Advanced Manufacturing & Engineering Division Institute for Infocomm Research (I2R),Visual Intelligence Department,Singapore,138632)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2020
号:
ICIP
ページ:
2131-2135
発行年:
2020年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)