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J-GLOBAL ID:202102276390659222   整理番号:21A1264074

高品質InAs/AlAs/InAsSb超格子に基づく中波長赤外光検出器のMBE成長【JST・京大機械翻訳】

MBE growth of mid-wavelength infrared photodetectors based on high quality InAs/AlAs/InAsSb superlattice
著者 (21件):
Jiang Jun-Kai
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Li Yong
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Chang Fa-Ran
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Cui Su-Ning
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Chen Wei-Qiang
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Jiang Dong-Wei
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Jiang Dong-Wei
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
Jiang Dong-Wei
(Center of Materials Science and Optoelectronics Engineering, College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China)
Wang Guo-Wei
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Wang Guo-Wei
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
Wang Guo-Wei
(Center of Materials Science and Optoelectronics Engineering, College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China)
Xu Ying-Qiang
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Xu Ying-Qiang
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
Xu Ying-Qiang
(Center of Materials Science and Optoelectronics Engineering, College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China)
Niu Zhi-Chuan
(State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
Niu Zhi-Chuan
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
Niu Zhi-Chuan
(Center of Materials Science and Optoelectronics Engineering, College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China)
Niu Zhi-Chuan
(Beijing Academy of Quantum Information Sciences, Beijing 100193, China)
Che Ren-chao
(Laboratory of Advanced Materials, Department of Materials Science, Collaborative Innovation Center of Chemistry for Energy Materials, Fudan University, Shanghai 200438, PR China)
Zhang Chuan-jie
(Wuhan Guide Infrared Co., Ltd., Wuhan 430205, China)
Huang Li
(Wuhan Guide Infrared Co., Ltd., Wuhan 430205, China)

資料名:
Journal of Crystal Growth  (Journal of Crystal Growth)

巻: 564  ページ: Null  発行年: 2021年 
JST資料番号: B0942A  ISSN: 0022-0248  資料種別: 逐次刊行物 (A)
記事区分: 原著論文  発行国: オランダ (NLD)  言語: 英語 (EN)
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