文献
J-GLOBAL ID:202102288960593175
整理番号:21A2326117
p-GaNゲートHEMTの表面ポテンシャルベースコンパクトモデリング【JST・京大機械翻訳】
Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs
著者 (6件):
Wang Jie
(The Key Laboratory for RF Circuit and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou 310012, China)
,
Chen Zhanfei
(The Key Laboratory for RF Circuit and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou 310012, China)
,
You Shuzhen
(Interuniversity Microelectronics Centre (IMEC), Kapeldreef 75, B-3001 Leuven, Belgium)
,
Bakeroot Benoit
(CMST, IMEC, Ghent University, Technologiepark 126, B-9052 Ghent, Belgium)
,
Liu Jun
(The Key Laboratory for RF Circuit and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou 310012, China)
,
Decoutere Stefaan
(Interuniversity Microelectronics Centre (IMEC), Kapeldreef 75, B-3001 Leuven, Belgium)
資料名:
Micromachines (Web)
(Micromachines (Web))
巻:
12
号:
2
ページ:
199
発行年:
2021年
JST資料番号:
U7247A
ISSN:
2072-666X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
スイス (CHE)
言語:
英語 (EN)