文献
J-GLOBAL ID:202202211419353322
整理番号:22A0501697
ExaAM:微細構造の忠実度における金属付加製造シミュレーション【JST・京大機械翻訳】
ExaAM: Metal additive manufacturing simulation at the fidelity of the microstructure
著者 (20件):
Turner John A
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Belak James
( Lawrence Livermore National Laboratory (LLNL) , Livermore, CA, USA)
,
Barton Nathan
( Lawrence Livermore National Laboratory (LLNL) , Livermore, CA, USA)
,
Bement Matthew
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Carlson Neil
( Los Alamos National Laboratory (LANL) , Los Alamos, NM, USA)
,
Carson Robert
( Lawrence Livermore National Laboratory (LLNL) , Livermore, CA, USA)
,
DeWitt Stephen
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Fattebert Jean-Luc
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Hodge Neil
( Lawrence Livermore National Laboratory (LLNL) , Livermore, CA, USA)
,
Jibben Zechariah
( Los Alamos National Laboratory (LANL) , Los Alamos, NM, USA)
,
King Wayne
( The Barnes Global Advisors , Stuart, FL, USA)
,
Levine Lyle
( National Institute of Standards and Technology (NIST) , Gaithersburg, MD, USA)
,
Newman Christopher
( Los Alamos National Laboratory (LANL) , Los Alamos, NM, USA)
,
Plotkowski Alex
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Radhakrishnan Balasubramaniam
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Reeve Samuel Temple
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Rolchigo Matthew
( Lawrence Livermore National Laboratory (LLNL) , Livermore, CA, USA)
,
Sabau Adrian
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Slattery Stuart
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
,
Stump Benjamin
( Oak Ridge National Laboratory (ORNL) , Oak Ridge, TN, USA)
資料名:
International Journal of High Performance Computing Applications
(International Journal of High Performance Computing Applications)
巻:
36
号:
1
ページ:
13-39
発行年:
2022年
JST資料番号:
T0485A
ISSN:
1094-3420
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)