文献
J-GLOBAL ID:202202219408964677
整理番号:22A1085998
増分および減衰特徴のための計量学習の進化【JST・京大機械翻訳】
Evolving Metric Learning for Incremental and Decremental Features
著者 (6件):
Dong Jiahua
(State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China)
,
Cong Yang
(State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China)
,
Sun Gan
(State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China)
,
Zhang Tao
(State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China)
,
Tang Xu
(State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China)
,
Xu Xiaowei
(Department of Information Science, University of Arkansas at Little Rock, Little Rock, AR, USA)
資料名:
IEEE Transactions on Circuits and Systems for Video Technology
(IEEE Transactions on Circuits and Systems for Video Technology)
巻:
32
号:
4
ページ:
2290-2302
発行年:
2022年
JST資料番号:
W0321A
ISSN:
1051-8215
CODEN:
ITCTEM
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)