文献
J-GLOBAL ID:202202227254136694
整理番号:22A1043495
位相減衰双対性による低X線エネルギーでの信頼性のある材料特性評価【JST・京大機械翻訳】
Reliable material characterization at low x-ray energy through the phase-attenuation duality
著者 (5件):
Buchanan I.
(Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, London WC1E 6BT, United Kingdom)
,
Astolfo A.
(Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, London WC1E 6BT, United Kingdom)
,
Endrizzi M.
(Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, London WC1E 6BT, United Kingdom)
,
Bate D.
(Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, London WC1E 6BT, United Kingdom)
,
Olivo A.
(Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, London WC1E 6BT, United Kingdom)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
120
号:
12
ページ:
124102-124102-6
発行年:
2022年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)