文献
J-GLOBAL ID:202202235590331104
整理番号:22A0562605
マイクロディスプレイのための正に注目できない歪モデルに基づく動的偽輪郭評価法【JST・京大機械翻訳】
Dynamic false contour evaluation method based on just noticeable distortion model for microdisplays
著者 (7件):
Chen Wendong
(School of Mechatronic Engineering and Automation, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Ji Yuan
(School of Mechatronic Engineering and Automation, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Ji Yuan
(Microelectronic Research and Development Center, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Zhang Kaiwen
(Microelectronic Research and Development Center, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Mu Tingzhou
(School of Mechatronic Engineering and Automation, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Ran Feng
(School of Mechatronic Engineering and Automation, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
,
Ran Feng
(Microelectronic Research and Development Center, Shanghai University, No. 99 Shangda Road, Shanghai 200444, China)
資料名:
Displays
(Displays)
巻:
71
ページ:
Null
発行年:
2022年
JST資料番号:
C0042B
ISSN:
0141-9382
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)