文献
J-GLOBAL ID:202202237117536509
整理番号:22A0398036
長期短期メモリネットワークと局所極値を用いた熱障壁被覆のテラヘルツベース厚み測定【JST・京大機械翻訳】
Terahertz Based Thickness Measurement of Thermal Barrier Coatings Using Long Short-Term Memory Networks and Local Extrema
著者 (6件):
Sun Fengshan
(School of Mechatronic Engineering, China University of Mining and Technology, Xuzhou, China)
,
Fan Mengbao
(School of Mechatronic Engineering, China University of Mining and Technology, Xuzhou, China)
,
Cao Binghua
(School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, China)
,
Zheng Dedong
(School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, China)
,
Liu Hai
(School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, China)
,
Liu Lin
(Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing, China)
資料名:
IEEE Transactions on Industrial Informatics
(IEEE Transactions on Industrial Informatics)
巻:
18
号:
4
ページ:
2508-2517
発行年:
2022年
JST資料番号:
W1434A
ISSN:
1551-3203
CODEN:
ITIICH
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)