文献
J-GLOBAL ID:202202237277494011
整理番号:22A0482098
スピンボーイング軌道トルク磁気トンネル接合のナノ構造におけるイオン化と変位損傷【JST・京大機械翻訳】
Ionization and Displacement Damage on Nanostructure of Spin-Orbit Torque Magnetic Tunnel Junction
著者 (15件):
Wang Bi
(School of Integrated Circuit Science and Engineering and the School of Electronics and Information Engineering, Beihang University, Beijing, China)
,
Wang Min
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Zhang Hongchao
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Wang Zhaohao
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Zhuo Yudong
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Ma Xiangyue
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Cao Kaihua
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
,
Wang Liang
(Beijing Microelectronics Technology Institute, Beijing, China)
,
Zhao Yuanfu
(Beijing Microelectronics Technology Institute, Beijing, China)
,
Wang Tianqi
(Space Environment Simulation and Research Infrastructure and the School of Materials Science and Engineering, Harbin Institute of Technology, Harbin, China)
,
Liu Chaoming
(Space Environment Simulation and Research Infrastructure and the School of Materials Science and Engineering, Harbin Institute of Technology, Harbin, China)
,
Zhang Hongqiang
(School of Nuclear Science and Technology, Lanzhou University, Lanzhou, China)
,
Zhang Youguang
(School of Electronics and Information Engineering, Beihang University, Beijing, China)
,
Wang Jun
(School of Electronics and Information Engineering, Beihang University, Beijing, China)
,
Zhao Weisheng
(Fert Beijing Research Institute, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China)
資料名:
IEEE Transactions on Nuclear Science
(IEEE Transactions on Nuclear Science)
巻:
69
号:
1
ページ:
43-49
発行年:
2022年
JST資料番号:
C0235A
ISSN:
0018-9499
CODEN:
IETNAE
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)