文献
J-GLOBAL ID:202202238339720924
整理番号:22A0396667
3D X点フレームワークのためのナノ結晶ZnO層の制御されたAgドーピングによる高信頼性選択挙動【JST・京大機械翻訳】
Highly Reliable Selection Behavior With Controlled Ag Doping of Nano-Polycrystalline ZnO Layer for 3D X-Point Framework
著者 (10件):
Sahota Akshay
(Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Kim Harrison Sejoon
(Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Mohan Jaidah
(Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Jung Yong Chan
(Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Hernandez-Arriaga Heber
(Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Le Dan N.
(Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA)
,
Kim Si Joon
(Department of Electrical and Electronics Engineering and the Interdisciplinary Graduate Program in BIT Medical Convergence, Kangwon National University, Chuncheon, Gangwon-do, Republic of Korea)
,
Lee Jang-Sik
(Department of Material Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Republic of Korea)
,
Ahn Jinho
(Division of Materials Science and Engineering, Hanyang University, Seongdong-gu, Seoul, Republic of Korea)
,
Kim Jiyoung
(Division of Materials Science and Engineering, Hanyang University, Seongdong-gu, Seoul, Republic of Korea)
資料名:
IEEE Electron Device Letters
(IEEE Electron Device Letters)
巻:
43
号:
1
ページ:
21-24
発行年:
2022年
JST資料番号:
B0344B
ISSN:
0741-3106
CODEN:
EDLEDZ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)