文献
J-GLOBAL ID:202202246536099500
整理番号:22A0974516
Raman分光法を用いた非van der Waals Bi_2O_2Seにおける線欠陥の可視化【JST・京大機械翻訳】
Visualizing Line Defects in non-van der Waals Bi2O2Se Using Raman Spectroscopy
著者 (9件):
Kim Un Jeong
(Advanced Sensor Laboratory, Samsung Advanced Institute of Technology, Gyeonggi-do, Republic of Korea)
,
Nam Seung Hyun
(Department of Materials Science and Engineering, Inha University, Republic of Korea)
,
Seo Juyeon
(Department of Materials Science and Engineering, Inha University, Republic of Korea)
,
Yang Mino
(Korea Basic Science Institute Seoul, Republic of Korea)
,
Fu Qundong
(School of Materials Science & Engineering, Nanyang Technological University, Singapore)
,
Liu Zheng
(School of Materials Science & Engineering, Nanyang Technological University, Singapore)
,
Son Hyungbin
(School of Integrative Engineering, Chung-Ang University, Republic of Korea)
,
Lee Moonsang
(Department of Materials Science and Engineering, Inha University, Republic of Korea)
,
Hahm Myung Gwan
(Department of Materials Science and Engineering, Inha University, Republic of Korea)
資料名:
ACS Nano
(ACS Nano)
巻:
16
号:
3
ページ:
3637-3646
発行年:
2022年
JST資料番号:
W2326A
ISSN:
1936-0851
CODEN:
ANCAC3
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)