文献
J-GLOBAL ID:202202257187470007
整理番号:22A1118053
結晶試料の再構成された出口波動関数における残留収差の直接推定と補正【JST・京大機械翻訳】
Direct estimation and correction of residual aberrations in the reconstructed exit-wavefunction of a crystalline specimen
著者 (7件):
Chen Z.K.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
,
Ming W.Q.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
,
He Y.T.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
,
Shen R.H.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
,
Chen G.S.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
,
Yin M.J.
(Electron Microscopy Center, Shenzhen University, Shenzhen, Guangdong 518060, China)
,
Chen J.H.
(Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan University, Changsha, Hunan 410082, China)
資料名:
Micron
(Micron)
巻:
157
ページ:
Null
発行年:
2022年
JST資料番号:
E0318E
ISSN:
0968-4328
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)