文献
J-GLOBAL ID:202202261583290616
整理番号:22A0788393
NEMSデバイスのCD-SEMSを予測するための深層学習【JST・京大機械翻訳】
Deep Learning for Predicting CD-SEMS of NEMS Devices
著者 (13件):
Davaji Benyamin
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Cook Peter A
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Kor Bahar
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Luo Ziwang
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Chen Jiaxian
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Clark Jeremy
(Cornell University,Cornell Nanoscale Science and Technology Facility,Ithaca,New York)
,
Bordonaro Garry
(Cornell University,Cornell Nanoscale Science and Technology Facility,Ithaca,New York)
,
Genova Vincent
(Cornell University,Cornell Nanoscale Science and Technology Facility,Ithaca,New York)
,
Heuser Marco
(Hitachi High Technologies America, Inc)
,
Ayres Steve
(Hitachi High Technologies America, Inc)
,
Ober Christopher K
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Doerschuk Peter C
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
,
Lal Amit
(School of Electrical and Computer Engineering, Cornell University,Ithaca,New York)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2022
号:
MEMS
ページ:
462-465
発行年:
2022年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)