文献
J-GLOBAL ID:202202261956145059
整理番号:22A0906329
複合故障モードを考慮したIGBT寿命モデル【JST・京大機械翻訳】
IGBT lifetime model considering composite failure modes
著者 (5件):
Li Lie
(School of Electrical Engineering and Automation, Wuhan University, 430072, China)
,
He Yigang
(School of Electrical Engineering and Automation, Wuhan University, 430072, China)
,
Wang Lei
(School of Electrical Engineering and Automation, Wuhan University, 430072, China)
,
Wang Chuankun
(School of Electrical Engineering and Automation, Wuhan University, 430072, China)
,
Liu Xiaoyan
(School of Electrical Engineering and Automation, Wuhan University, 430072, China)
資料名:
Materials Science in Semiconductor Processing
(Materials Science in Semiconductor Processing)
巻:
143
ページ:
Null
発行年:
2022年
JST資料番号:
W1055A
ISSN:
1369-8001
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)