文献
J-GLOBAL ID:202202275509995365
整理番号:22A0779794
拡張SWIRイメージング用の15μmピッチの2.45μm 1280 102 1024 InGaAs焦点面アレイ【JST・京大機械翻訳】
2.45-μm 1280 ・ 1024 InGaAs Focal Plane Array With 15-μm Pitch for Extended SWIR Imaging
著者 (9件):
Cheng J. F.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Li X.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Shao X. M.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Li T.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Ma Y. J.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Gu Y.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Deng S. Y.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Zhang Y. G.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
,
Gong H. M.
(State Key Laboratories of Transducer Technology and the Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China)
資料名:
IEEE Photonics Technology Letters
(IEEE Photonics Technology Letters)
巻:
34
号:
4
ページ:
231-234
発行年:
2022年
JST資料番号:
T0721A
ISSN:
1041-1135
CODEN:
IPTLEL
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)