文献
J-GLOBAL ID:202202276146108607
整理番号:22A0829815
YFeO_3薄膜における逆位相境界によって安定化されたアンチサイト欠陥【JST・京大機械翻訳】
Antisite Defects Stabilized by Antiphase Boundaries in YFeO3 Thin Films
著者 (11件):
Kumar Abinash
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Klyukin Konstantin
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Ning Shuai
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Ozsoy-Keskinbora Cigdem
(Transmission Electron Microscopy Division, Thermo Fisher Scientific, Eindhoven, 5651GG, Netherlands)
,
Ovsyanko Mikhail
(Transmission Electron Microscopy Division, Thermo Fisher Scientific, Eindhoven, 5651GG, Netherlands)
,
van Uden Felix
(Transmission Electron Microscopy Division, Thermo Fisher Scientific, Eindhoven, 5651GG, Netherlands)
,
Krijnen Ruud
(Transmission Electron Microscopy Division, Thermo Fisher Scientific, Eindhoven, 5651GG, Netherlands)
,
Yildiz Bilge
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Yildiz Bilge
(Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Ross Caroline A.
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
LeBeau James M.
(Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
資料名:
Advanced Functional Materials
(Advanced Functional Materials)
巻:
32
号:
9
ページ:
e2107017
発行年:
2022年
JST資料番号:
W1336A
ISSN:
1616-301X
CODEN:
AFMDC6
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)