文献
J-GLOBAL ID:202202277868950437
整理番号:22A0683723
加速試験データをモデル化するための半量子アプローチ【JST・京大機械翻訳】
A semi-quantum approach for modelling the accelerated test data
著者 (6件):
Lin Kunsong
(School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China)
,
Lin Kunsong
(Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing 100191, PR China)
,
Zhu Jiaxiao
(School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China)
,
Zhu Jiaxiao
(Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing 100191, PR China)
,
Chen Yunxia
(School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China)
,
Chen Yunxia
(Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing 100191, PR China)
資料名:
Applied Mathematical Modelling
(Applied Mathematical Modelling)
巻:
104
ページ:
474-485
発行年:
2022年
JST資料番号:
H0624A
ISSN:
0307-904X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)