文献
J-GLOBAL ID:202202286135536066
整理番号:22A0736702
μm薄線量測定層による深さ線量曲線と表面線量測定【JST・京大機械翻訳】
Depth dose curve and surface dose measurement with a μm thin dosimetric layer
著者 (8件):
Schuster Christiane
(Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Maria-Reiche-Strasse 2, 01109 Dresden, Germany)
,
Kuntz Florent
(Aerial, Parc D’innovation, 250 Rue Laurent Fries, 67400, Illkirch, France)
,
Cloetta Dominique
(Ebeam Technologies, COMET AG, Herrengasse 10, 3175, Flamatt, Switzerland)
,
Zeller Marcel
(Ebeam Technologies, COMET AG, Herrengasse 10, 3175, Flamatt, Switzerland)
,
Katzmann Julia
(Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Maria-Reiche-Strasse 2, 01109 Dresden, Germany)
,
Strasser Alain
(Aerial, Parc D’innovation, 250 Rue Laurent Fries, 67400, Illkirch, France)
,
Haertling Thomas
(Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Maria-Reiche-Strasse 2, 01109 Dresden, Germany)
,
Lavalle Marco
(Tetra Pak Packaging Solutions, Via Delfini 1, 41123, Modena, Italy)
資料名:
Radiation Physics and Chemistry
(Radiation Physics and Chemistry)
巻:
193
ページ:
Null
発行年:
2022年
JST資料番号:
D0627A
ISSN:
0969-806X
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)