文献
J-GLOBAL ID:202202286349356212
整理番号:22A1113430
アレイ上のゲートドライバの電気化学的耐食性を改善するためのインジウム-スズ-酸化物膜厚の調整【JST・京大機械翻訳】
Adjusting indium-tin-oxide film thickness to improve electrochemical corrosion resistance of gate driver on array
著者 (6件):
Yu Xiang
(Beijing Key Laboratory of Materials Utilization of Nonmetallic Minerals and Solid Wastes, National Laboratory of Mineral Materials, School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China)
,
Zhao Wenjing
(Beijing Key Laboratory of Materials Utilization of Nonmetallic Minerals and Solid Wastes, National Laboratory of Mineral Materials, School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China)
,
Yang Lei
(Beijing Key Laboratory of Materials Utilization of Nonmetallic Minerals and Solid Wastes, National Laboratory of Mineral Materials, School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China)
,
Zhang Pingping
(Beijing Key Laboratory of Materials Utilization of Nonmetallic Minerals and Solid Wastes, National Laboratory of Mineral Materials, School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China)
,
Zhang Zhiqiang
(Beijing Key Laboratory of Materials Utilization of Nonmetallic Minerals and Solid Wastes, National Laboratory of Mineral Materials, School of Materials Science and Technology, China University of Geosciences (Beijing), Beijing 100083, China)
,
Zhang Zhiqiang
(Product Development Center, Beijing BOE Optoelectronics Technology Co., Ltd, Beijing 100176, China)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
750
ページ:
Null
発行年:
2022年
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)