文献
J-GLOBAL ID:202202289883592355
整理番号:22A1036539
TFT-LCDパネルのための畳込みニューラルネットワーク法に基づく新しいマルチカテゴリー欠陥検出法【JST・京大機械翻訳】
A Novel Multicategory Defect Detection Method Based on the Convolutional Neural Network Method for TFT-LCD Panels
著者 (5件):
Chang Yung-Chia
( Department of Industrial Engineering and Management, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan)
,
Chang Kuei-Hu
( Department of Management Sciences, R.O.C. Military Academy, Kaohsiung 830, Taiwan)
,
Chang Kuei-Hu
( Institute of Innovation and Circular Economy, Asia University, Taichung 413, Taiwan)
,
Meng Hsien-Mi
( Department of Industrial Engineering and Enterprise Information, Tunghai University, Taichung, 407, Taiwan)
,
Chiu Hung-Chih
( Department of Industrial Engineering and Management, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan)
資料名:
Mathematical Problems in Engineering (Web)
(Mathematical Problems in Engineering (Web))
巻:
2022
ページ:
Null
発行年:
2022年
JST資料番号:
U7803A
ISSN:
1024-123X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)