B. S. Chaudhari, H. Goto, M. Niraula, K. Yasuda. Analysis of dislocations and their correlation with dark currents in CdTe/Si heterojunction diode-type x-ray detectors. J. Appl. Phys. 2021. 130. 055302 -(1 )-055302 -(5)
M. Niraula, K. Yasuda, R. Torii, Y. Higashira, R. Tamura, B. S. Chaudhari, T. Kobayashi, H. Goto, S. Fujii, Y. Agata. Properties of iodine-doped CdTe layers on (211) Si grown at high substrate temperatures by MOVPE. Journal of Electronic Materials. 2020. 49. 11. 6996-6999
Low Temperature Annealing of CdTe Detectors with Evaporated Gold Contacts and its effect on Detector Performance
(IEEE-2021 The 28th International Symposium on Room-Temperature Semiconductor Detectors (RTSD) 2021)
Growth and characterization of single-crystal lead halide perovskite for X-ray detector application
(IEEE-2021 The 28th International Symposium on Room-Temperature Semiconductor Detectors (RTSD) 2021)
Perovskite Single Crystal Growth for for X-ray Detector Application
(2021年 第82回応用物理学会 秋季学術講演会 2021)
Evaluation of dislocation densities and their distribution in epitaxial (211)CdTe/Si
(2021年 第68回応用物理学会 春季学術講演会 2021)