Shinnosuke Yasuoka, Takao Shimizu, Kazuki Okamoto, Nana Sun, Soshun Doko, Naoko Matsui, Toshikazu Irisawa, Koji Tsunekawa, Alexei Gruverman, Hiroshi Funakubo. Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single- and Tri-Layered Structures With Different Sc/(Al+Sc) Ratio. Advanced Materials Interfaces. 2024. 2400627
Yoshiki Maekawa, Takanori Mimura, Yoshiyuki INAGUMA, Hiroshi UCHIDA, Yuxian Hu, Kazuki Okamoto, Hiroshi Funakubo. Ta5+-substitution effects on crystal structure and ferroelectric property in HfO2-based films. Japanese Journal of Applied Physics. 2024
Yuxian Hu, Rurika Kubota, Kazuki Okamoto, Takahisa Shiraishi, Hiroshi Funakubo. Effects of the alkaline solution concentration and deposition temperature on film thickness, crystal structure and ferroelectric properties of epitaxial PbTiO<sub>3</sub> films grown by hydrothermal method. Journal of the Ceramic Society of Japan. 2024. 132. 7. 295-303
Yoshiomi Hiranaga, Yuki Noguchi, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho. Data-Driven Analysis of High-Resolution Hyperspectral Image Data Sets through Nanoscale Capacitance-Voltage Measurements to Visualize Ferroelectric Domain Dynamics. ACS Applied Nano Materials. 2024. 7. 8. 8525-8536
Takanori Mimura, Yuma Takahashi, Takahisa Shiraishi, Masanori Kodera, Reijiro Shimura, Keisuke Ishihama, Kazuki Okamoto, Hiroki Moriwake, Ayako Taguchi, Takao Shimizu, et al. Phase Identification of 850 nm Thick 7%YO1.5-93%HfO2 Films by Surface and Cross-Sectional Raman Spectroscopies. ACS Applied Electronic Materials. 2024. 6. 4. 2500-2506