Yuto Sugawa, Chisato Murakami, Mamoru Ohara. C Source Code Generation from IR towards Making Bug Samples to Fluctuate for Machine Learning. 2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops. 2024. 321-328
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C Source Code Generation from IR towards Making Bug Samples to Fluctuate for Machine Learning
(2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops 2024)