A Study on Relationship between ESD and Radiation Noise
論文 (74件):
Sosuke Matsumoto, Takahiro Yoshida. Malfunction of a Wearable Device Caused by Potential Drop of a Charged Proximity Object Due to Electrostatic Discharge. Proc. of 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa. 2024. 210-213
Fuga Horie, Takahiro Yoshida. Improvement of Functional Printed Patterns for Electrical Over Stress Protection and Its Performance Evaluation. Proc. of 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa. 2024. 198-201
Taoyu Ma, Takahiro Yoshida. Impedance Dependencies of TVS Diode's Response Against ESD Stress. Proc. of 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa. 2024. 206-209
Takehiro Hagimoto, Takahiro Yoshida. Characteristics of a Long Duration Noise Induced on a Wearable Devices by Potential Drop of a Charged Proximity Object Caused by ESD. Proc. of 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa. 2024. 202-205
Shunichi Tomura, Koki Yamada, Takahiro Yoshida. Frequency Bandwidth Reduction of High-Frequency Intra-Body Propagation Characteristics Used for Attacker's Touch Detection in Fingerprint Authentication. Proc. of 2023 IEEE 12th Global Conference on Consumer Electronics (IEEE GCCE 2023). 2023. 488-490
Mitsuki Takeishi, Gerald Schickhuber, Takahiro Yoshida, Roland Mandl. Development of Character Recognition Method for German Car Number Plates. 電子情報通信学会ソサイエティ大会講演論文集. 2023
Malfunction of a Wearable Device Caused by Potential Drop of a Charged Proximity Object Due to Electrostatic Discharge
(2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa 2024)
Improvement of Functional Printed Patterns for Electrical Over Stress Protection and Its Performance Evaluation
(2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa 2024)
Impedance Dependencies of TVS Diode's Response Against ESD Stress
(2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa 2024)
Characteristics of a Long Duration Noise Induced on a Wearable Devices by Potential Drop of a Charged Proximity Object Caused by ESD
(2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan/APEMC Okinawa 2024)