研究者

J-GLOBAL ID：200901067903284302 更新日: 2024年07月17日

Bolotov Leonid

ボロトフレオニード | Bolotov Leonid

所属機関・部署：
ホームページURL (1件)： http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=L49359752

研究分野 (3件)：薄膜、表面界面物性 , 数理物理、物性基礎 , ナノ構造物理

論文 (63件)：

Leonid Bolotov, Shinji Migita, Ryouta Fujio, Manabu Ishimaru, Shogo Hatayama, Noriyuki Uchida. Impact of annealing on electric and elastic properties of 10-nm Hf0.5Zr0.5O2 films prepared on Si by sputtering. Microelectronic Engineering. 2022. 258
Leonid Bolotov, Paul Fons, Hidetoshi Mimura, Takafumi Sasaki, Noriyuki Uchida. Electronic modification of wet-prepared Si surfaces by a dichlorosilane reaction at elevated temperature. Applied Surface Science. 2021. 570
Leonid Bolotov, Noriyuki Uchida, Shinji Migita. Lateral variations of the surface electric potential and elastic stiffness of ultrathin Hf0.5Zr0.5O2films on silicon. AIP Advances. 2021. 11. 1
Noriyuki Uchida, Yuta Nakajima, Leonid Bolotov, Wen-Hsin Chang, Tatsuro Maeda, Yuji Ohishi. Heat transport properties of alumina gate insulator films on Ge substrates fabricated by atomic layer deposition. Materials Science in Semiconductor Processing. 2021. 121. 105396-105396
Vladimir Poborchii, Alexander Shklyaev, Leonid Bolotov, Noriyuki Uchida. Nanoscale characterization of photonic metasurface made of lens-like SiGe Mie-resonators formed on Si (100) substrate. Journal of Applied Physics. 2019. 126. 12

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MISC (26件)：

福田浩一, 西澤正泰, 多田哲也, BOLOTOV Leonid, 鈴木腕, 佐藤成生, 有本宏, 金山敏彦. 招待講演 STMによるキャリア分布測定のデバイスシミュレーション (シリコン材料・デバイス). 電子情報通信学会技術研究報告 : 信学技報. 2011. 111. 281. 21-26
金山敏彦, 西澤正泰, Bolotov Leonid. 走査型トンネル顕微鏡を用いた二次元不純物分布計測. 應用物理. 2008. 77. 9. 1103-1106
NISHIZAWA Masayasu, BOLOTOV Leonid, KANAYAMA Toshihiko. Dopant-atom distribution measurement at p-n junctions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy. Extended abstracts of the ... Conference on Solid State Devices and Materials. 2006. 2006. 346-347
M Nishizawa, L Bolotov, T Tada, T Kanayama. Scanning tunneling microscopy detection of individual dopant atoms on wet-prepared Si(111): H surfaces. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 2006. 24. 1. 365-369
L Bolotov, T Okui, T Kanayama. Scanning resonant tunneling spectroscopy of fullerene molecules on Si surfaces for carrier density profiling across p-n junctions. APPLIED PHYSICS LETTERS. 2005. 87. 13. 133107-133109

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特許 (1件)：

Surface potential profile measurement method

経歴 (1件)：

2010/09 - 2014/03 University of Tsukuba Faculty of Pure and Applied Science associate professor

委員歴 (2件)：

2015/12 - 現在 Material Research Society Materials
1999/02 - 現在 American Physical Society Physics

所属学会 (4件)：

Materials Research Society of Japan , Nanotechnology Australia , American Physical Society , Material Research Society

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