Hidenobu Mori, Haruhiko Yoshida. Effect of Post Deposition Annealing on Electrical Properties of GaOx/Si structure by Mist Chemical Vapor Deposition Method. 2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK). 2022
Shinobu Onoda, Toshio Hirao, Jamie Stuart Laird, Hidenobu Mori, Hisayoshi Itoh, Takeshi Wakasa, Tsuyoshi Okamoto, Yoshiharu Koizumi. Estimation of fast transient current degradation analyzed by non-ionizing energy loss. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003. 210. 232-236
2018/06 - IEEE Kansai Chapter IMFEDK Best Paper Award Microscopic characterization of generation lifetime in insulator/semiconductor structure by scanning capacitance microscopy