文献
J-GLOBAL ID:200902185361033819
整理番号:02A0013143
Bi12SiO20結晶を用いた光電圧測定でのλ/4板の影響
Influence of a Quarter Wave Plate on the Modulation Depth Caused by Pockels Effect in Bi12SiO20 Crystal for Optical Voltage Measurement.
-
出版者サイト
{{ this.onShowPLink() }}
複写サービスで全文入手
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=02A0013143©=1") }}
-
高度な検索・分析はJDreamⅢで
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=02A0013143&from=J-GLOBAL&jstjournalNo=S0175A") }}