Uemura Taiki

所属機関・部署：

研究分野 (1件)：電子デバイス、電子機器

論文 (16件)：

MISC (47件)：

Sungman Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shinyoung Chung. Machine Learning Based V-ramp V_BD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. 2023 IEEE International Reliability Physics Symposium (IRPS). 2023
Taiki Uemura, Byungjin Chung, Shinyoung Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae. Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. 2023 IEEE International Reliability Physics Symposium (IRPS). 2023
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida. Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. 2022 IEEE International Reliability Physics Symposium (IRPS). 2022
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida. Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. 2022 IEEE International Reliability Physics Symposium (IRPS). 2022
T. Uemura, B. Chung, J. Jo, M. Kim, D. Lee, G. Kim, S. Lee, T. Song, H. Rhee, B. Lee, et al. Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. 2021 IEEE International Reliability Physics Symposium (IRPS). 2021

特許 (40件)：

Sequential Circuit, Scan Chain Circuit Including the Same and Integrated Circuit Including the Same
Semiconductor device
Semiconductor device
Data holding circuit
Latch circuit

講演・口頭発表等 (6件)：

[Year-in-Review] Soft Error in Planar, FDSOI, FinFET, and GAA
(IEEE International Reliability Physics Symposium (IRPS) 2023)
最新ソフトエラー対策技術と今後の展望
(ソフトエラー勉強会 2013)
ソフトエラー評価技術と対策技術
(集積回路研究会 2012)
大規模計算機向け半導体デバイスにおけるソフトエラー -最高レベルの信頼性を求めて-
(ソフトエラー勉強会 2012)
ソフトエラー評価技術・対策技術の研究開発戦略
(ソフトエラー勉強会 2011)

委員歴 (6件)：

- 現在 IEEE International Reliability Physics Symposium (IRPS) 2023-2024 Management committee
- 現在 IEEE International Reliability Physics Symposium (IRPS) 2012-2018, 2021-2024 Technical Committee (Radiation Effect)
2008 - 2022 IEEE International On-Line Testing Symposium (IOLTS) Program Committee
2014 - 2015 Silicon Errors in logic - System Effects (SELSE) Review Committee
2011 - IEEE International Conference on IC Design and Technology (ICICDT) 2011 Technical Program Committee

全件表示

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