Kentaroh Katoh, Toru Nakura, Xiaoqing Wen, Haruo Kobayashi. A Fine Delay Measurement Using Forward and Backward Phase Shift for Online Failure Prediction and Analysis. Journal of Technology and Social Science (JTSS). 2024. 8. 1. 12-22
Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, et al. Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. IEICE Electronics Express. 2023. 20. 1. 20220470-20220470
Shuhei Yamamoto, Yuto Sasaki, Yujie Zhao, Anna Kuwana, Kentaroh Katoh, Zheming Zhang, Jianglin Wei, Tri Minh Tran, Shogo Katayama, Keno Sato, et al. Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration. IEEE Transactions on Device and Materials Reliability. 2022. 22. 2. 142-153
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, et al. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. Journal of Electronic Testing. 2022. 38. 1. 21-38
Kentaro KATO, Somsak CHOOMCHUAY. An Analysis of Time Domain Reed Solomon Decoder with FPGA Implementation. IEICE Transactions on Information and Systems. 2017. E100.D. 12. 2953-2961
Haruo Kobayashi, Tomohiko Ogawa, Yutaro Kobayashi, Kentaroh Katoh, Jiangling Wei. Toward Unification of Digital Error Correction Algorithms for ADCs with Redundancy. IEEE 17th International Conference on Solid-State and Integrated Circuit Technology. 2024
Haruo Kobayashi, Keno Sato, Takayuki Nakatani, Shuhei Yamamoto, Anna Kuwana, Yujie Zhao, Jianglin Wei, Kentaroh Katoh. Renaissance of ADC Testing Fundamentals. IEEE 6th International Conference on Circuits and Systems. 2024
Haruo Kobayashi, Kentatoh Katoh. Error Correction and Self-Calibration of Analogue- Digital Mixed-Signal Integrated Circuits. International Summit on Semiconductors, Optoelectronics and Nanostructures (ISSON2024),. 2024
Kentaroh Katoh, Toru Nakura, Xiaoqing Wen, Haruo Kobayashi. A Fine On-Chip Online Delay Measurement Using a MUX Chain for Failure Prediction and Analysis. the 7th International Conference on Technology and Social Science ICTSS 2023. 2023
Keno Sato, Takayuki Nakatani, Takeshi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie, Zhao, Shuhei Yamamoto, et al. Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. IEEE Int. Test Conf., Oct. 2023, to appaear. 2023