Keiichiro Urabe, Minami Toyoda, Yoshinori Matsuoka, Koji Eriguchi. Investigation of small-fraction molecular impurities in high-pressure helium plasmas using optical plasma diagnostic methods. Plasma Sources Science and Technology. 2024. 33. 2. 025011-025011
Junki Morozumi, Takahiro Goya, Tomohiro Kuyama, Koji Eriguchi, Keiichiro Urabe. In situ electrical monitoring of SiO2/Si structures in low-temperature plasma using impedance spectroscopy. Japanese Journal of Applied Physics. 2023. 62. SI. SI1010-SI1010
Yoshihiro Sato, Satoshi Shibata, Kazuko Nishimura, Masayuki Yamasaki, Masashi Murakami, Keiichiro Urabe, Koji Eriguchi. Predicting the effects of plasma-induced damage on p-n junction leakage and its application in the characterization of defect distribution. Journal of Vacuum Science & Technology B. 2022. 40. 6. 062209-062209
Seiya Kito, Keiichiro Urabe, Koji Eriguchi. Multi-harmonic analysis in a floating harmonic probe method for diagnostics of electron energy and ion density in low-temperature plasmas. Japanese Journal of Applied Physics. 2022. 61. 10. 106002-106002
T. Matsuda, T. Hamano, Y. Asamoto, M. Noma, M. Yamashita, S. Hasegawa, K. Urabe, K. Eriguchi. Ion irradiation-induced sputtering and surface modification of BN films prepared by a reactive plasma-assisted coating technique. Japanese Journal of Applied Physics. 2022. 61. SI. SI1014-SI1014
Plasma-Induced Damage: Modeling and Characterization
(2022 IEEE International Integrated Reliability Workshop (IIRW) 2022)
Plasma-induced damage
(2021 IEEE International Integrated Reliability Workshop (IIRW), Reliability Experts Forum 2021)
Comprehensive Characterization of Surface Modification Mechanisms in Boron Nitride Films Prepared by a Reactive Plasma-assisted Coating Technique
(The 47th ICMCTF 2021)
Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS)
(IEEE Int. Reliability Physics Symp (IRPS) 2021)
Plasma-induced Damage-Modeling and Characterizations
(International Symposium on Semiconductor Manufacturing (ISSM 2020) 2020)
2011/11 - 応用物理学会(DPS) DPS 2010 Young Researcher Award
2011/08 - 応用物理学会 第33回(2011年度)応用物理学会優秀論文賞
2011/03 - 応用物理学会 第9回(2011年度)プラズマエレクトロニクス賞
2010/11 - 応用物理学会 DPS 2009 Best Paper Award
全件表示
所属学会 (5件):
日本航空宇宙学会
, 日本真空学会
, 応用物理学会:シリコンテクノロジー分科会,プラズマエレクトロニクス分科会
, AVS (American Vacuum Society)
, IEEE (The Institute of Electrical and Electronics Engineers, Inc.): Electron Device Society, Reliability Society