Aoi Ueda, Michihiro Shintani, Michiko Inoue, Takashi Sato. Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. 2020 IEEE 29th Asian Test Symposium (ATS). 2020. B4-2
Yohei Nakamura, Naotaka Kuroda, Atsushi Yamaguchi, Ken Nakahara, Michihiro Shintani, Takashi Sato. Influence of Device Parameter Variability on Current Sharing of Parallel-Connected SiC MOSFETs. 2020 IEEE 29th Asian Test Symposium (ATS). 2020. B4-1
Michihiro Shintani, Tomoki Mino, Michiko Inoue. LBIST-PUF: An LBIST Scheme Towards Efficient Challenge-Response Pairs Collection and Machine-Learning Attack Tolerance Improvement. IEEE Asian Test Symposium (ATS). 2020. A7-2
Foisal Ahmed, Michihiro Shintani, Michiko Inoue. Cost-efficient Recycled FPGA Detection through Statistical Performance Characterization Framework. IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2020. E103-A. 9. 1045-1053
Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue. Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit. Journal of Electronic Testing: Theory and Applications. 2020. 36. 4. 537-546