Du Wan-Ying について
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, People’s Republic of China について
Du Wan-Ying について
Key Laboratory of Optoelectronic Information Technology (Ministry of Education),Tianjin University, Tianjin 300072, People’s Republic of China について
Du Wan-Ying について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Zhang Pei について
Department of Mechanical Engineering and Materials, Tianjin Sino-German Vocational Technical College, No. 2 Yanshan Road, Haihe Education Park, Tianjin 300350, People’s Republic of China について
Zhang Pei について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Zhang Zi-Bo について
University of Toulouse 3, Faculty of Engineering, 118 Route de Narbonne, F-31062 Toulouse, France について
Zhang Zi-Bo について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Ren Shuai について
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, People’s Republic of China について
Ren Shuai について
Key Laboratory of Optoelectronic Information Technology (Ministry of Education),Tianjin University, Tianjin 300072, People’s Republic of China について
Ren Shuai について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Wong Wing-Han について
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, People’s Republic of China について
Wong Wing-Han について
University of Toulouse 3, Faculty of Engineering, 118 Route de Narbonne, F-31062 Toulouse, France について
Wong Wing-Han について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Yu Dao-Yin について
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, People’s Republic of China について
Yu Dao-Yin について
Key Laboratory of Optoelectronic Information Technology (Ministry of Education),Tianjin University, Tianjin 300072, People’s Republic of China について
Yu Dao-Yin について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Pun Edwin Yue-Bun について
University of Toulouse 3, Faculty of Engineering, 118 Route de Narbonne, F-31062 Toulouse, France について
Pun Edwin Yue-Bun について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Zhang De-Long について
Department of Opto-electronics and Information Engineering, School of Precision Instruments and Opto-electronics Engineering, Tianjin University, Tianjin 300072, People’s Republic of China について
Zhang De-Long について
Key Laboratory of Optoelectronic Information Technology (Ministry of Education),Tianjin University, Tianjin 300072, People’s Republic of China について
Zhang De-Long について
University of Toulouse 3, Faculty of Engineering, 118 Route de Narbonne, F-31062 Toulouse, France について
Zhang De-Long について
Department of Electronic Engineering and State Key Laboratory of Millimeter Waves, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, People’s Republic of China について
Journal of Physics and Chemistry of Solids について
結晶 について
干渉測定 について
クランプ について
ニオブ酸リチウム について
Czochralski法 について
ドーピング について
欠陥構造 について
共ドーピング について
ドーピング効果 について
融液 について
電気光学係数 について
ニオブ酸リチウム について
Er~3+ドーピング について
~3+/Er~3+共ドーピング について
電気光学特性 について
無機化合物のルミネセンス について
その他の無機化合物の電気伝導 について
その他の無機化合物の格子欠陥 について
金属酸化物及び金属カルコゲン化物の結晶構造 について
ドープ について
結晶 について
電気光学係数 について