研究者
J-GLOBAL ID:201801014930594422   更新日: 2019年12月18日

坂巻 亮

Ryo Sakamaki
所属機関・部署:
論文 (17件):
  • Array,Array. Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process. IEEE Trans. Instrumentation and Measurement. 2019. 68. 6. 1748-1755
  • Sakamaki Ryo, Horibe Masahiro, Yoshida Manabu, Tsurumi Takaaki. Demonstration of dielectric measurement using a probe-backside reflection method up to 300 GHz. JAPANESE JOURNAL OF APPLIED PHYSICS. 2019. 58
  • Sakamaki Ryo, Horibe Masahiro, Yoshida Manabu. Transmission loss of screen-printed metallization at millimeter-wave frequency. IEICE ELECTRONICS EXPRESS. 2019. 16. 3. 20181081
  • Probe Positioner and Probe Tip Calibration for Traceable On-wafer Measurement. 2019 92ND ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG). 2019
  • Sakamaki Ryo, Horibe Masahiro. Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. 2018. 67. 8. 1940-1945
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MISC (18件):
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特許 (18件):
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