D. Kikuta, R. Kishida, K. Kobayashi. Ring Oscillators with identical Circuit Structure to Measure Bias Temperature Instability. IEEE International Conference on ASIC (ASICON). 2023. D8-5
Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi. An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process. 2022 IEEE International Reliability Physics Symposium (IRPS). 2022
Y. Susa, R. Kishida, T. Matsuura, and A. Hyogo. Mode Transition Improvement by Adding Load Current Sensing Circuit in a Buck-Boost Converter for Mobile Devices. Workshop on Synthesis And System Integration of Mixed Information Technologies (SASIMI). 2021. 132-136
R. Kishida, I. Suda, and K. Kobayashi. Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IEEE International Reliability Physics Symposium (IRPS). 2021. 4A.6.1-4A.6.6
K. Saito, R. Kishida, T. Matsuura, and A. Hyogo. A K-band High Gain Linearity Mixer with Current-Bleeding and Derivative Superposition Technique. Workshop on Synthesis And System Integration of Mixed Information Technologies (SASIMI). 2021. 51-55