Julius Joseph Santillan, Akihiro Konda, Motoharu Shichiri, Toshiro Itani. Single-component silicon-based patterning materials for EUV lithography. Proc. SPIE. 2023. Advances in Patterning Materials and Processes XL. 12498. 1249814
Masahiko Harumoto, Andreia Figueiredo dos Santos, JULIUS JOSEPH SANTILLAN, Toshiro Itani, Takahiro KOZAWA. Photoresist stochastic defect generation depending on alkyl chain length and concentration of tetraalkylammonium hydroxide in alkali aqueous developer. Japanese Journal of Applied Physics. 2023. 62. SG1037
Masahiko Harumoto, Andreia Figueiredo dos Santos, Julius Joseph Santillan, Toshiro Itani, Takahiro Kozawa. Stochastic defect generation depending on tetraalkylhydroxide aqueous developers in extreme ultraviolet lithography. Japanese Journal of Applied Physics. 2023. 62. 1. 016503-016503
Julius Joseph Santillan, Kyoko Shimizu, Ryuichi Otogawa, Toshiro Itani. Effect of Alternative Developer Solutions on EUVL Patterning. Journal of Photopolymer Science and Technology. 2022. 35. 1. 67-74
Masahiko Harumoto, Julius Joseph Santillan, Toshiro Itani, Takahiro Kozawa. Dependence of photoresist dissolution dynamics in alkaline developers on alkyl chain length of tetraalkylammonium hydroxide. Japanese Journal of Applied Physics. 2022. 61. 5. 056506-056506
Extremely large depth-of-focus lithography system using KrF excimer laser
(32nd International Microprocesses and Nanotechnology Conference 2019)
Alternative developer solutions and processes for EUV lithography
(SPIE Photomask Technology + Extreme Ultraviolet Lithography 2019)
Alternative developer solutions and processes for EUV and ArFi lithography
(The 36th International Conference of Photopolymer Science and Technology 2019)
Resist patterning characteristics using KrF laser ablation process
(The 36th International Conference of Photopolymer Science and Technology 2019)