文献

J-GLOBAL ID：201902201257909772   整理番号：19S1701107

Negative differential resistance characteristics of nanoscale in-plane gate devices

著者 (9件)： Komatsuzaki, Yuji (School of Science and Engineering, Waseda University) ,  Komatsuzaki, Yuji (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Higashi, Kazuhiro (School of Science and Engineering, Waseda University) ,  Higashi, Kazuhiro (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Kyougoku, Tomoteru (School of Science and Engineering, Waseda University) ,  Kyougoku, Tomoteru (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Horikoshi, Yoshiji (School of Science and Engineering, Waseda University) ,  Horikoshi, Yoshiji (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Onomitsu, Koji (NTT Basic Reseach Laboratories, NTT Corporation)
資料名： Physica Status Solidi (C) Current Topics in Solid State Physics
巻： 8  号： 2  ページ： 408-410  発行年： 2011年 
JST資料番号： SCOPUS  ISSN： 1862-6351 
発行国： ドイツ (DEU)  言語： 英語 (EN)