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J-GLOBAL ID：201902213460287009   整理番号：19S1266576

Characterization of a Gafchromic film for the two-dimensional profile measurement of low-energy heavy-ion beams

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著者 (3件)：
Yuri, Yosuke

Yuri, Yosuke について

(Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology)

Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology について

, 
Narumi, Kazumasa

Narumi, Kazumasa について

(Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology)

Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology について

, 
Yuyama, Takahiro

Yuyama, Takahiro について

(Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology)

Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology について


資料名：
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment について


巻： 828  ページ： 15-21  発行年： 2016年 
JST資料番号： SCOPUS  ISSN： 0168-9002  CODEN： NIMAE 
発行国： オランダ (NLD)  言語： 英語 (EN)

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