Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang. Measurement of Current Waveform Due to Different Load of ESD Gun, TLP-HMM, and CR-HMM. 2023 45th Annual EOS/ESD Symposium (EOS/ESD). 2023. TP-TH-PM2-TC2. 603-603
Yusuke Yano, Kazuha Ishida, Jianqing Wang, Takeshi Ishida. Influence of cable length between TLP test system and DUT and its correction for CMC ESD saturation measurement. IEICE Communications Express. 2023. 1-7
Yusuke Yano, Hideki Iwasaki, Jianqing Wang. Investigation of Reducing Test System Dependence for Automotive Ethernet EMC Evaluation. 2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI). 2023. 624-624
Masahiro Yoshida, Yusuke Yano, Takeshi Ishida, Jianqing Wang. Improvement of TLP-HMM’s Load Dependence. 2023 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI). 2023. 381-381
Tohlu Matsushima, Akito Kagawa, Yusuke Yano, Yuki Fukumoto. Cable Height Dependence in Radiated Immunity Evaluation of Automotive Ethernet 100BASE-T1. 35th URSI General Assembly and Scientific Symposium (URSI GASS 2023). 2023. E08-4
2023/10 - 電子情報通信学会 TOP DOWNLOADED LETTER AWARD Influence of cable length between TLP test system and DUT and its correction for CMCESD saturation measurement
2021/03 - IEEE EMC Society Japan Joint Chapter IEEE EMC Society Japan Joint / Sendai Chapters Student Award 2020