文献
J-GLOBAL ID:200902223166394326
整理番号:06A0138891
超薄膜Siチャンネルおよび自己整合したソースとドレインを持つ縦型2重ゲート金属-酸化物-半導体電界効果トランジスターの作製と評価
Fabrication and characterization of vertical-type double-gate metal-oxide-semiconductor field-effect transistor with ultrathin Si channel and self-aligned source and drain
著者 (10件):
MASAHARA Meishoku
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
LIU Yongxun
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
ENDO Kazuhiko
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
MATSUKAWA Takashi
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
SAKAMOTO Kunihiro
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
ISHII Kenichi
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
O’UCHI Shinichi
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
SUGIMATA Etsuro
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
YAMAUCHI Hiromi
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
,
SUZUKI Eiichi
(Nanoelectronics Res. Inst., National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
88
号:
7
ページ:
072103-072103-3
発行年:
2006年02月13日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)