文献
J-GLOBAL ID:200902263798998997
整理番号:04A0255431
低k二次元周期多孔質シリカ膜における弾性定数と誘電率の理論解析
Theoretical Analysis of Elastic Modulus and Dielectric Constant for Low-k Two-Dimensional Periodic Porous Silica Films
著者 (9件):
MIYOSHI H
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
MATSUO H
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
OKU Y
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
TANAKA H
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
YAMADA K
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
MIKAMI N
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
,
TAKADA S
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
HATA N
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
KIKKAWA T
(Assoc. Super-Advanced Electronics Technol. (ASET), Ibaraki, JPN)
資料名:
Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers
(Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers)
巻:
43
号:
2
ページ:
498-503
発行年:
2004年02月15日
JST資料番号:
G0520B
ISSN:
0021-4922
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
日本 (JPN)
言語:
英語 (EN)