文献
J-GLOBAL ID:200902269091431050
整理番号:08A0428560
二ビーム干渉測定を用いた新しい表面力装置
New surface forces apparatus using two-beam interferometry
著者 (7件):
KAWAI Hiroshi
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
SAKUMA Hiroshi
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
MIZUKAMI Masashi
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
ABE Takashi
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
FUKAO Yasuhiro
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
TAJIMA Haruo
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
,
KURIHARA Kazue
(Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
資料名:
Review of Scientific Instruments
(Review of Scientific Instruments)
巻:
79
号:
4
ページ:
043701
発行年:
2008年04月
JST資料番号:
D0517A
ISSN:
0034-6748
CODEN:
RSINAK
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)